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Article · 2020

Investigation of radiation defects in thin films (case of Tashkent)

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20.1002/fizmatj/2020/i9/12026591Open on nationaldri.uzEnglish

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  • 20.1002/fizmatj/2020/i3/77384751

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Authors

  1. Haydarov Botir Odil o'g'liORCID 0000-0002-0014-8094 (opens in a new tab)

    Mirzo Ulug'bek nomidagi O'zbekiston Milliy universiteti

  2. S. To'xtayevano linked profile

    Qozon federal universiteti

  3. Saidov U.Sh.no linked profile

    Kazakh National University

  4. Shukurova N.M.no linked profile

    Мирзо Улуғбек номидаги Ўзбекистон Миллий университети

Abstract

The article examines investigation of radiation defects in thin films (case of Tashkent). A comparative analysis of international experience is provided. Practical recommendations are proposed.

Bibliographic details

DRI
20.1002/fizmatj/2020/i9/12026591
Work type
Article
Journal
O'zMU fizika-matematika jurnaliISSN 2181-0117
Volume and issue
No. 9
Pages
6–10
Published
23 March 2020
Language
English
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synced 21/09/2026, 16:48, version 2

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